Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Marcin Zielinski

5PUBLICATIONS

18CO-AUTHORS

Elemental semiconductorsCeramicsCompound semiconductorsInstruments and techniques

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (5)

Sort by Publication Date:

|May 27, 2023

Impact of Doping on Cross-Sectional Stress Assessment of 3C-SiC/Si Heteroepitaxy.

Viviana Scuderi, Marcin Zielinski, Francesco La Via

|Sep 28, 2021

Measurement of Residual Stress and Young's Modulus on Micromachined Monocrystalline 3C-SiC Layers Grown on <111> and <100> Silicon.

Sergio Sapienza, Matteo Ferri, Luca Belsito

|Sep 28, 2021

New Approaches and Understandings in the Growth of Cubic Silicon Carbide.

Francesco La Via, Massimo Zimbone, Corrado Bongiorno

|Oct 23, 2019

3C-SiC Growth on Inverted Silicon Pyramids Patterned Substrate.

Massimo Zimbone, Marcin Zielinski, Corrado Bongiorno

|Jul 27, 2019

Limitations during Vapor Phase Growth of Bulk (100) 3C-SiC Using 3C-SiC-on-SiC Seeding Stacks.

Philipp Schuh, Johannes Steiner, Francesco La Via

Pageof 1

Frequent Collaborators

3 joint publications

Francesco La Via

2 joint publications

Peter Wellmann

2 joint publications

Giuseppe Fisicaro

1 joint publications

Johannes Steiner

1 joint publications

Silvia Scalese

1 joint publications

Corrado Bongiorno

1 joint publications

Antonino La Magna

1 joint publications

Ioannis Deretzis

1 joint publications

Filippo Giannazzo

1 joint publications

Emilio Scalise

Frequent Collaborators

3 joint publications

Francesco La Via

2 joint publications

Peter Wellmann

2 joint publications

Giuseppe Fisicaro

1 joint publications

Johannes Steiner

Top Related Videos

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on : Jul 17, 2015

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on : Sep 28, 2016

See more related videos

Top Related Videos

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on : Jul 17, 2015

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Probing C<sub>84</sub>-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on : Sep 28, 2016

See more related videos