Frank Siewert

7PUBLICATIONS
58CO-AUTHORS
Instruments and techniquesGlassAutomated software engineeringElemental semiconductorsMetals and alloy materials
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Publications (7)

|Dec 05, 2025
Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniques.

Analía F Herrero, Nazanin Samadi, Andrey Sokolov

|Dec 02, 2025
The 8th International Workshop on X-ray Optics and Metrology-IWXM 2024.

Frank Siewert, Michael Krumrey, Lahsen Assoufid

|Dec 01, 2025
Advanced electron beam lithography strategies for fabrication of high-precision VLS x-ray gratings.

Kevin Hofhuis, Nazanin Samadi, Bjarke A Frederiksen

|Aug 27, 2025
Improving the quality of x-ray mirrors: An inter-lab, optical metrology collaboration to guide deterministic polishing.

Simon G Alcock, Ioana-Theodora Nistea, Murilo Bazan da Silva

|Dec 20, 2024
The Heisenberg-RIXS instrument at the European XFEL.

Justine Schlappa, Giacomo Ghiringhelli, Benjamin E Van Kuiken

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