Frank Siewert

7PUBLICATIONS
58CO-AUTHORS
Instruments and techniquesGlassElemental semiconductorsMetals and alloy materials
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Publications (7)

|Jun 16, 2026
Diffractive wavefront correction for Fe L-edge spectroscopy on the meV scale.

|Dec 05, 2025
Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniques.

Analía F Herrero, Nazanin Samadi, Andrey Sokolov

|Dec 01, 2025
Advanced electron beam lithography strategies for fabrication of high-precision VLS x-ray gratings.

Kevin Hofhuis, Nazanin Samadi, Bjarke A Frederiksen

|Aug 27, 2025
Improving the quality of x-ray mirrors: An inter-lab, optical metrology collaboration to guide deterministic polishing.

Simon G Alcock, Ioana-Theodora Nistea, Murilo Bazan da Silva

|Dec 20, 2024
The Heisenberg-RIXS instrument at the European XFEL.

Justine Schlappa, Giacomo Ghiringhelli, Benjamin E Van Kuiken

|Jul 18, 2023
X-FAST: A versatile, high-throughput, and user-friendly XUV femtosecond absorption spectroscopy tabletop instrument.

Ryan Ash, Zain Abhari, Roberta Candela

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Frequent Collaborators

4 joint publications

Andrey Sokolov

2 joint publications

Christiaan Zonnevylle

2 joint publications

Analía F Herrero

2 joint publications

Christian David