Qianru Zheng

1PUBLICATIONS
2CO-AUTHORS
Data communications
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

|Feb 27, 2026
High-Sensitivity Defect Inspection for Unpatterned Wafers via Integrating Dark-Field Scattering and Diffraction Phase Microscopy.

Xiangchao Zhang, Qianru Zheng, Di Li

Pageof 1

Frequent Collaborators

1 joint publications

Xiangchao Zhang

1 joint publications

Ruifang Ye