Dominik Kirpal
2PUBLICATIONS
6CO-AUTHORS
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Publications (2)
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|Jul 10, 2021
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.Dominik Kirpal, Jinglan Qiu, Korbinian Pürckhauer
|Sep 03, 2020
Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions.Korbinian Pürckhauer, Simon Maier, Anja Merkel
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