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Updated: Dec 10, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic
Korbinian Pürckhauer1, Simon Maier1, Anja Merkel1
1Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Abstract:
Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion coefficient, we can perform constant height measurements and achieve atomic resolution in both AFM and STM on various samples. Moreover, the design allows a wide angle optical access to the sensor and the sample that is of interest for combining with optical microscopes or focusing optics with a high numerical aperture.
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