T Szarvas
2PUBLICATIONS
0CO-AUTHORS
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Publications (2)
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|Jul 10, 2021
Bulk micro-defect detection with low-angle illumination.T Szarvas, G Molnár, Gy Nádudvari
|Jul 10, 2021
Application of light scattering tomography for Si(111) samples.T Szarvas, Sz Pothorszky, D Erdei
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