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T Szarvas

2PUBLICATIONS

0CO-AUTHORS

Compound semiconductors

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Publications (2)

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|Jul 10, 2021

Bulk micro-defect detection with low-angle illumination.

T Szarvas, G Molnár, Gy Nádudvari

|Jul 10, 2021

Application of light scattering tomography for Si(111) samples.

T Szarvas, Sz Pothorszky, D Erdei

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