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T V Kazieva

1PUBLICATIONS

1CO-AUTHORS

Microelectromechanical systems (MEMS)

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Publications (1)

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|Mar 02, 2021

Accuracy of the interferometric method for Leeb hardness testers calibration.

T V Kazieva, K L Gubskiy, I Yu Tischenko

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I Yu Tischenko

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I Yu Tischenko

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