I Yu Tischenko

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1CO-AUTHORS
Microelectromechanical systems (MEMS)
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Publications (1)

|Mar 02, 2021
Accuracy of the interferometric method for Leeb hardness testers calibration.

T V Kazieva, K L Gubskiy, I Yu Tischenko

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Frequent Collaborators

1 joint publications

T V Kazieva