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Jiahao Yan, Jiajun Ma, Aiwei Wang
Ruisong Ma, Qing Huan, Liangmei Wu

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on : Jan 19, 2018

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on : Jun 13, 2023