Markus Zeier
2PUBLICATIONS
3CO-AUTHORS
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Publications (2)
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|Mar 02, 2021
Advanced calibration kit for scanning microwave microscope: Design, fabrication, and measurement.T Le Quang, A C Gungor, D Vasyukov
|Mar 03, 2018
Scanning microwave microscopy applied to semiconducting GaAs structures.Arne Buchter, Johannes Hoffmann, Alexandra Delvallée
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