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P Zuppella

1PUBLICATIONS
1CO-AUTHORS
Photonics, optoelectronics and optical communications
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Journal

Publications (1)

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|Feb 03, 2018
EUV polarimetry for thin film and surface characterization and EUV phase retarder reflector development.

A E H Gaballah, P Nicolosi, Nadeem Ahmed

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Nadeem Ahmed

Frequent Collaborators

1 joint publications

Nadeem Ahmed

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