Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Paul L M J van Neer

2PUBLICATIONS

2CO-AUTHORS

Solar system planetary science (excl. planetary geology)Nonlinear optics and spectroscopy

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Oct 02, 2020

Publisher's Note: "On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing" [Rev. Sci. Instrum. 91, 083702 (2020)].

Daniele Piras, Paul L M J van Neer, Rutger M T Thijssen

|Sep 03, 2020

On the resolution of subsurface atomic force microscopy and its implications for subsurface feature sizing.

Daniele Piras, Paul L M J van Neer, Rutger M T Thijssen

Pageof 1

Frequent Collaborators

2 joint publications

Daniele Piras

2 joint publications

Hamed Sadeghian

Frequent Collaborators

2 joint publications

Daniele Piras

2 joint publications

Hamed Sadeghian

Top Related Videos

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on : Dec 20, 2016

See more related videos

Top Related Videos

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on : Dec 20, 2016

See more related videos