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S H Nowak, R Armenta, C P Schwartz+14
Tod A Pascal, Craig P Schwartz, Keith V Lawler+1
S H Nowak
A T Garcia-Esparza
D Sokaras
Tod A Pascal
Keith V Lawler
David Prendergast
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on : Aug 25, 2016
Application of Monolayer Graphene to Cryo-Electron Microscopy Grids for High-resolution Structure Determination
Published on : Nov 10, 2023