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Chengxi Ding

2PUBLICATIONS
3CO-AUTHORS
Electrical circuits and systemsCompound semiconductors
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Journal

Publications (2)

Sort by Publication Date:
|May 07, 2025
Study of ZrO<sub>2</sub> Gate Dielectric with Thin SiO<sub>2</sub> Interfacial Layer in 4H-SiC Trench MOS Capacitors.

Qimin Huang, Yunduo Guo, Anfeng Wang

|Apr 11, 2025
Reduction of Interface State Density in 4H-SiC MOS Capacitors Modified by ALD-Deposited Interlayers.

Zhenyu Wang, Zhaopeng Bai, Yunduo Guo

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Frequent Collaborators

2 joint publications

Qimin Huang

2 joint publications

Yi Shen

2 joint publications

Hongping Ma

Frequent Collaborators

2 joint publications

Qimin Huang

2 joint publications

Yi Shen

2 joint publications

Hongping Ma

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