Chengxi Ding
2PUBLICATIONS
3CO-AUTHORS
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Publications (2)
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|May 07, 2025
Study of ZrO2 Gate Dielectric with Thin SiO2 Interfacial Layer in 4H-SiC Trench MOS Capacitors.Qimin Huang, Yunduo Guo, Anfeng Wang
|Apr 11, 2025
Reduction of Interface State Density in 4H-SiC MOS Capacitors Modified by ALD-Deposited Interlayers.Zhenyu Wang, Zhaopeng Bai, Yunduo Guo
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