Axel Verdianu
2PUBLICATIONS
19CO-AUTHORS

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Publications (2)
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|Nov 21, 2025
A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection.Alexander Karl, Axel Verdianu, Dominic Waldhoer
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Frequent Collaborators
2 joint publications
Theresia Knobloch
2 joint publications
Tibor Grasser
2 joint publications
Hailin Peng
2 joint publications
Congwei Tan
1 joint publications
Christoph Wilhelmer
1 joint publications
Dominic Waldhoer
1 joint publications
Joël Kurzweil
1 joint publications
Pedram Khakbaz
1 joint publications
Bernhard Stampfer
1 joint publications
Yury Illarionov