Bernhard Stampfer
4PUBLICATIONS
17CO-AUTHORS
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Publications (4)
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|Nov 21, 2025
A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection.Alexander Karl, Axel Verdianu, Dominic Waldhoer
|Jul 25, 2023
Observation of Rich Defect Dynamics in Monolayer MoS<sub>2</sub>.Harikrishnan Ravichandran, Theresia Knobloch, Andrew Pannone
|Apr 29, 2020
Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors.Bernhard Stampfer, Franz Schanovsky, Tibor Grasser
|Jun 08, 2018
Characterization of Single Defects in Ultrascaled MoS<sub>2</sub> Field-Effect Transistors.Bernhard Stampfer, Feng Zhang, Yury Yuryevich Illarionov
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Frequent Collaborators
2 joint publications
Michael Waltl
2 joint publications
Theresia Knobloch
2 joint publications
Saptarshi Das
1 joint publications
Alexander Karl
1 joint publications
Axel Verdianu
1 joint publications
Dominic Waldhoer
1 joint publications
Joël Kurzweil
1 joint publications
Pedram Khakbaz
1 joint publications
Seyed Mehdi Sattari-Esfahlan
1 joint publications
Yury Illarionov
