Michael Waltl
6PUBLICATIONS
26CO-AUTHORS
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Publications (6)
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|Nov 21, 2025
A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection.Alexander Karl, Axel Verdianu, Dominic Waldhoer
|Aug 26, 2023
Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4).Christoph Wilhelmer, Dominic Waldhoer, Lukas Cvitkovich
|Jul 05, 2022
Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning.Theresia Knobloch, Burkay Uzlu, Yury Yu Illarionov
|Aug 06, 2020
Reliability of Miniaturized Transistors from the Perspective of Single-Defects.Michael Waltl
|Apr 29, 2020
Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors.Bernhard Stampfer, Franz Schanovsky, Tibor Grasser
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Frequent Collaborators
4 joint publications
Tibor Grasser
2 joint publications
Bernhard Stampfer
2 joint publications
Theresia Knobloch
2 joint publications
Yury Yu Illarionov
2 joint publications
Dominic Waldhoer
1 joint publications
Burkay Uzlu
1 joint publications
Zhenxing Wang
1 joint publications
Martin Otto
1 joint publications
Lado Filipovic
1 joint publications
Daniel Neumaier
