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Updated: Jul 2, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

单个分子通过原子力显微镜充电

Chuleekorn Chotsuwan1, Silas C Blackstock

  • 1Department of Chemistry and The Center for Materials for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487, USA.

Journal of the American Chemical Society
|September 3, 2008
PubMed
概括

研究人员使用原子力显微镜 (AFM) 和凯尔文探针力显微镜 (KPM) 演示电化学充电和检测单个聚胺分子. 这种技术允许在低介电材料中精确地绘制低氧活性有机分子的电荷映射.

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Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy10:06

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...