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Updated: May 26, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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在4D电子显微镜中进行子粒子超快光谱成像

Aycan Yurtsever1, Renske M van der Veen, Ahmed H Zewail

  • 1Physical Biology Center for Ultrafast Science and Technology, Arthur Amos Noyes Laboratory of Chemical Physics, California Institute of Technology, Pasadena, CA 91125, USA.

Science (New York, N.Y.)
|January 7, 2012
PubMed
概括

研究人员开发了子粒子成像,实现了纳米空间,五分秒时间和毫电子伏特能量分辨率. 这种技术绘制纳米级介电场的地图,增强了元素分析和等离子学研究.

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Published on: October 9, 2012

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