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Updated: Jul 19, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

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增强扫描电子显微镜使用自动优化图像恢复与受约束最小方程过器用于纳米科学

Junhyeok Hwang1,2, In-Yong Park1,2, Min Kyo Jung3

  • 1Advanced Instrumentation Institute, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-ro, Yuseong, Daejeon 34113, Republic of Korea.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|August 16, 2023
PubMed
概括

本研究介绍了一种自动优化算法,用于恢复扫描电子显微镜 (SEM) 图像,显著增强纳米尺度特征的可视化. 该方法通过平衡清晰度,对比度和噪音来提高图像质量,而不需要用户的专业知识.

关键词:
解体解体是一种解体.图像处理是图像处理的过程.图像恢复 图像恢复 图像恢复纳米材料的使用方法点差函数的点差函数是一个点差函数.扫描电子显微镜扫描电子显微镜

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