使X线.

Nicholas W M Ritchie1, Andrew Herzing1, Vladimir P Oleshko1

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

概括

这项研究引入了一种新的量化模型,用于使用X射线光谱分析薄膜. 该模型准确地确定单层和多层薄膜的组成和质量厚度,增强材料分析.

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