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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Atomic Force Microscopy01:08

Atomic Force Microscopy

3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K
Magnetic Moment of an Electron01:23

Magnetic Moment of an Electron

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Electrons revolving around a nucleus are analogous to a circular current carrying loop. This current produces a magnetic dipole moment proportional to the electron's orbital angular momentum. Since the orbital angular momentum is quantized in terms of the reduced Planck's constant, the dipole moment is quantized in the Bohr Magneton. The value of the Bohr magneton is 9.27 x 10-24 Am2. Electrons also have an intrinsic spin angular momentum, and the associated spin magnetic moment is...
1.4K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.2K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.2K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

9.2K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.2K
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.4K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.4K

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相关实验视频

Updated: Jul 10, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

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动量转移解决了电子相关性显微镜.

Shuoyuan Huang1, Paul M Voyles1

  • 1Department of Materials Science and Engineering, University of Wisconsin Madison, Madison, WI 53706, USA.

Ultramicroscopy
|November 24, 2023
PubMed
概括

电子相关显微镜 (ECM) 现在为研究超冷液体提供动量空间分辨率. 这种新的k分辨率ECM技术揭示了金属玻璃中复杂的放松动态.

科学领域:

  • 材料科学 材料科学 材料科学
  • 凝聚物质物理学 凝聚物质物理学
  • 电子显微镜电子显微镜

背景情况:

  • 电子相关显微镜 (ECM) 对于理解波动系统中的局部结构放松动态至关重要.
  • 超冷液体,特别是金属玻璃,表现出复杂的放松行为,很难描述.
  • 现有的技术往往缺乏必要的空间或动量分辨率.

研究的目的:

  • 开发和实施一种新的k分辨率电子相关显微镜 (k分辨率ECM) 技术.
  • 为了研究金属超冷液体的空间和动量解析放松动态.
  • 建立可靠的k-解析ECM数据采集所需的实验参数.

主要方法:

  • 利用五维扫描传输电子显微镜在动量转移 (k空间) 中实现中等分辨率.
  • 将k分辨率的ECM应用于一个Pt57.5Cu14.7Ni5.3P22.5金属超冷液.
  • 在空间 (r) 和动量 (k) 域中分析了放松时间数据 τ(r,k).

主要成果:

  • 在放松时间数据中测量了丰富的空间和动量结构t (r,k).
  • 证明了在每个亚齐木图 k 的放松时间图 τ(r) 是放松时间分布的独立样本.
关键词:
在5D STEM中,电子相关显微镜电子相关显微镜在K-依赖动态中.超冷液体动力学 超冷液体动力学

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User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy
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User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy

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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

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相关实验视频

Last Updated: Jul 10, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Published on: July 3, 2021

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User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy
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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

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  • 与X射线实验中观察到的De Gennes缩小相比,在放射 k 的 τ 中观察到更复杂的行为.
  • 结论:

    • 开发的k分辨率ECM技术为超冷液体的动量依赖放松动态提供了前所未有的洞察力.
    • 这些发现挑战了现有的模型,并突出了金属玻璃结构放松的复杂性.
    • 定义了关键实验参数 (电子计数,k像素,时间采样) 以成功进行k分辨率的ECM测量.