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相关概念视频

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

5.5K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
9.2K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

626
Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
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Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

2.2K
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

486
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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相关实验视频

Updated: Jul 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

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具有磁性聚焦电子束的点场发射电子源.

Paweł Urbański1, Piotr Szyszka1, Marcin Białas1

  • 1Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, 11/17 Janiszewski St., 50-372 Wrocław, Poland.

Ultramicroscopy
|January 5, 2024
PubMed
概括

本研究介绍了一种用于高电流电子束的新型碳纳米管场发射器. 这种基于的电子源非常适合微电子机械系统 (MEMS) 的X射线和电子显微镜.

科学领域:

  • 材料科学 材料科学 材料科学
  • 物理 物理学 物理
  • 纳米技术 纳米技术

背景情况:

  • 电子源对于微电子和MEMS设备至关重要.
  • 微型电子源是需要的先进的应用程序,如MEMSX射线和电子显微镜.
  • 当前的电子源在当前输出和光束质量方面面临限制.

研究的目的:

  • 开发一种用于高性能电子束生成的新型电场发射器.
  • 将碳纳米管与尖相结合,以增强电场发射.
  • 为了研究使用联合静电和磁场的聚焦能力.

主要方法:

  • 用碳纳米管涂层的尖场发射器的制造.
  • 实现一个包括两个静电镜头和磁场的聚焦系统.
  • 场发射器性能的描述,包括排放电流和光束点特征.

主要成果:

  • 场发射器实现了大约50μA的高发射电流.
  • 电子束成功集中到一个小而均的点.
  • 结合的静电和磁性聚焦证明了对光束控制的有效性.

结论:

关键词:
静电聚焦 静电聚焦 静电聚焦场电子源是一个场电子源.在MEMS MEMS中使用.磁性聚焦是一种磁性聚焦.

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Preparing a Celadonite Electron Source and Estimating Its Brightness

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相关实验视频

Last Updated: Jul 6, 2025

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

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  • 开发的碳纳米管场发射器显示了微电子和MEMS应用的巨大潜力.
  • 这项技术为下一代MEMSX射线源和电子显微镜提供了有前途的解决方案.
  • 新的聚焦方法提高了这些电子源的效用.