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Updated: Jul 4, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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基于对Young干扰全息图的相位探测的光学传感,使用数字微镜装置

Théo Girerd, Fabien Mandorlo, Cécile Jamois

    Optics express
    |February 1, 2024
    PubMed
    概括

    我们开发了一种新的全息干扰测量技术,用于纳米光子传感器,使用数字微镜设备空间光调节器. 这种方法可以实现低相位噪声,用于增强传感器查询和温度传感应用.

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    Phase-Contrast Microscopes
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