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相关概念视频

Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

422
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
422
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

327
Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which...
327
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

946
Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
946
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

162
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
162
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
756

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Atomic Force Microscopy to Study the Physical Properties of Epidermal Cells of Live Arabidopsis Roots
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从一个细分的STEM探测器GaN原子电场:实验和模拟.

Tim Grieb1, Florian F Krause1, Thorsten Mehrtens1

  • 1Institute of Solid State Physics, University of Bremen, Bremen, Germany.

Journal of microscopy
|February 19, 2024
PubMed
概括
此摘要是机器生成的。

这项研究使用4D扫描传输电子显微镜 (4D-STEM) 与分段探测器测量化 (GaN) 中的原子电场. 该技术提供快速,低剂量测量,但有一些不确定性.

关键词:
在4D STEM中,商务委员会 商务委员会在 GaN GaN 中.质量中心质量中心.电场是指电场中的电场.一个动量解决的STEM.分段的STEM检测器检测器

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科学领域:

  • 材料科学 材料科学 材料科学
  • 固态物理 固态物理
  • 电子显微镜电子显微镜

背景情况:

  • 准确地描述原子级电场对于理解材料特性至关重要.
  • 传统方法可以通过辐射损伤或缓慢的获取速度来限制.

研究的目的:

  • 用一种新的4D-STEM方法测量薄化 (GaN) 样本中的原子电场.
  • 为了比较分段STEM探测器与像素化探测器和模拟器的性能.

主要方法:

  • 在4D扫描传输电子显微镜 (4D-STEM) 中利用质量中心方法.
  • 在Spectra 300显微镜上使用一个12段的STEM探测器,用于高速,低剂量数据采集.
  • 将实验结果与来自像素化4D-STEM探测器的详细模拟和测量进行了比较.

主要成果:

  • 在GaN样本中成功测量了原子电场,电荷密度和电位.
  • 分段探测器显示了高的记录速度,使得在降低的辐射剂量下进行测量.
  • 鉴定的测量不确定性源于本研究中分析的部分数量有限.

结论:

  • 分段STEM探测器是快速,低剂量原子电场测绘的有希望的工具.
  • 使用更多细分的进一步分析可以提高测量的准确性.
  • 这种方法为GaN等材料的电子结构提供了有价值的见解.