通过深度学习识别和结构性表征扭曲的原子薄双层材料

Haitao Yang1, Ruiqi Hu2, Heng Wu3

  • 1Key Laboratory of Wide Band-Gap Semiconductor Technology & Shaanxi Key Laboratory of High-Orbits-Electron Materials and Protection Technology for Aerospace, School of Advanced Materials and Nanotechnology, Xidian University, Xi'an 710071, China.

Nano letters
|February 26, 2024
PubMed
概括

这项研究引入了一种新的深度学习方法,用于分析二维材料. 卷积神经网络快速识别二硫化物厚度,并预测双层片中的扭曲角度,用于先进的电子产品.