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Updated: Jun 28, 2025

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM
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在现场的电化学原子力显微镜:从接口到接相

Wei-Wei Wang1,2, Hao Yan1,2, Yu Gu1,2

  • 11State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, China; email: jwyan@xmu.edu.cn, bwmao@xmu.edu.cn.

Annual review of analytical chemistry (Palo Alto, Calif.)
|April 11, 2024
PubMed
概括

原子力显微镜 (AFM) 促进了对电化学接口和接口相的理解. 这种技术为表征电极表面和电池等储能系统提供了至关重要的3D空间分辨率.

关键词:
原子力显微镜的原子力显微镜.电气双层电气 双层电气电化学接口 电化学接口强力光谱法 强力光谱法在现场高分辨率成像.电池是电池的使用方式.

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Interfacial electrochemical methods focus on the phenomena occurring at the boundary between an electrode and a solution, as opposed to bulk methods that concentrate on the solution's overall properties. These interfacial methods are classified as either static or dynamic based on the presence of a nonzero current in the electrochemical cell and the consistency of analyte concentrations. Static methods, such as potentiometry, measure the cell's potential without any significant current...
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