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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 6, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

在扫描道显微镜图像中进行波面扭曲校正.

Hoyeon Jeon¹, Saban Hus¹, Jewook Park¹

¹Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

The Review of scientific instruments

|May 9, 2024

概括

此摘要是机器生成的。

我们开发了一种算法来纠正原子分辨率扫描道显微镜图像中的波面扭曲. 这种方法通过分析里埃变换来完善二维图像,以修复非线性扭曲,而不需要先前的扫描数据.

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Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

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Last Updated: May 6, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

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科学领域:

材料科学材料科学材料科学
显微镜的使用方法
图像分析图像分析

背景情况:

像扫描道显微镜 (STM) 这样的原子分辨率显微镜技术对于纳米级成像至关重要.
图像扭曲,特别是非线性内平面扭曲,可能是由仪器因素引起的,使准确的分析变得复杂.
现有的后处理方法通常依赖于识别真实空间特征,这可能并不总是可行的或最佳的.

研究的目的:

引入一种新的算法,用于识别和纠正STM图像中扭曲的波面.
为了能够纠正非线性内平面扭曲,而不需要先前了解扫描参数或原子位置.
提供适用于各种2D成像技术的多功能工具.

主要方法:

将二维图像表示为正弦平面波的总和,其中扭曲表现为曲的波面.
使用局部图像区域的里埃变换来生成波面向量场.
线性化每个平面波组件的识别波面,同时保持晶格顺序以纠正扭曲.

主要成果:

在STM图像中成功识别和纠正非线性内平面扭曲.
演示算法在没有对扫描参数或原子位置的先验知识的情况下运行的能力.
验证该方法对其他显微镜技术的二维图像的适用性.

结论:

开发的算法提供了一种可靠的方法来纠正高分辨率显微镜中的波面扭曲.
这种方法通过减轻仪器工件的缺陷来提高纳米尺度成像的准确性.
该算法补充了现有的技术,并扩大了可靠的二维图像分析的范围.