Jove
Visualize
联系我们
JoVE
x logofacebook logolinkedin logoyoutube logo
关于 JoVE
概览领导团队博客JoVE 帮助中心
作者
出版流程编辑委员会范围与政策同行评审常见问题投稿
图书馆员
用户评价订阅访问资源图书馆顾问委员会常见问题
研究
JoVE JournalMethods CollectionsJoVE Encyclopedia of Experiments存档
教育
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab Manual教师资源中心教师网站
使用条款与条件
隐私政策
政策

相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.3K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.3K

您也可能阅读

相关文章

通过共同作者、期刊和引用图与本文相关的文章。

排序
Same author

All-Optical Nonlinear Real and Fourier-Space Shaping with All-Dielectric Fano Resonant Metasurfaces.

ACS nano·2026
Same author

Transmission matrix of a multimode fiber: In-line vs off-axis holography.

PloS one·2026
Same author

Influence of Driving Pulse Properties on Third-Harmonic Diffraction from Quasi-BIC Metasurfaces.

ACS photonics·2025
Same author

Information advantage in sensing revealed by Fano-resonant Fourier scatterometry.

Nature communications·2025
Same author

Structure-in-Void Quasi-Bound State in the Continuum Metasurface for Deeply Subwavelength Nanostructure Metrology.

ACS nano·2025
Same author

Absorption and amplification singularities in metasurface etalons with gain.

Nanophotonics (Berlin, Germany)·2025

相关实验视频

Updated: Jun 4, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces
09:33

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

6.2K

纳米交错位移计量使用衍射板拉特纳姆-贝里和绕行阶段元表面.

Nick Feldman1,2, Kian M M Goeloe1, Arie J den Boef2,3,4

  • 1Department of Information in Matter and Center for Nanophotonics, AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands.

ACS photonics
|December 23, 2024
PubMed
概括

这项研究引入了一种新的纳米级移位传感平台,使用衍射超表面和极度里埃显微镜. 它实现了对纳米位移的高精度测量,这对于半导体制造至关重要.

更多相关视频

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.2K
Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms
08:48

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

5.7K

相关实验视频

Last Updated: Jun 4, 2025

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces
09:33

Demonstration of Equal-Intensity Beam Generation by Dielectric Metasurfaces

Published on: June 7, 2019

6.2K
Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.2K
Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms
08:48

Demonstration of Spin-Multiplexed and Direction-Multiplexed All-Dielectric Visible Metaholograms

Published on: September 25, 2020

5.7K

科学领域:

  • 纳米技术和计量学
  • 光子学和元表面学

背景情况:

  • 精确的纳米结构对齐对于半导体制造至关重要.
  • 元光学提供了将纳米信息转换为可测量的信号的方法.

研究的目的:

  • 提出和演示一种新的交织移位传感平台.
  • 为了实现设备层中纳米尺度位移的高分辨率检测.

主要方法:

  • 采用了衍射性无极形元表面.
  • 采用极度对称里埃显微镜.
  • 杆的Pancharatnam-Berry和绕道的相位转移用于传感.

主要成果:

  • 展示了一个能够解决几纳米位移的平台.
  • 展示了纳米尺度移位的转导成极化特征.
  • 证实了平台能够解决任意的2D位移的能力.

结论:

  • 开发的平台为纳米尺度计量提供了一个强大的工具.
  • 传感机制依赖于元表面的组合相位移.
  • 该平台适用于设备制造中的高速计量技术.