EELS

Christian Zietlow1, Jörg K N Lindner1

  • 1Nanopatterning-Nanoanalysis-Photonic Materials Group, Department of Physics, Paderborn University, Warburgerstr. 100, Paderborn, 33098, Germany.

Ultramicroscopy
|January 17, 2025
PubMed
概括

在电子能量损失光谱学 (EELS) 中理解噪声至关重要. 本研究提供了一个噪声模型和方法来描述噪声参数,以改善扫描传输电子显微镜 (STEM) EELS数据质量.

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