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Updated: Jan 14, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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以定制扫描单元和基于事件的电子检测来推进时间分辨率光谱学

Yves Auad1, Florian Castioni1, Jassem Baaboura1

  • 1Laboratoire des Physique des Solides, Université Paris Saclay, Orsay, France.

Micron (Oxford, England : 1993)
|October 17, 2025
PubMed
概括

使用Timepix3技术的直接电子检测提供了增强的显微镜. 一个新的扫描单元可以使用连续枪电子显微镜进行先进的,时间解析的实验.

关键词:
电子能量损失光谱学 电子能量损失光谱学电子显微镜 电子显微镜基于事件的事件.混合像素直接探测器 混合像素直接探测器里萨乔斯扫描扫描的时间扫描单元扫描单位时间解决方案 时间解决方案时间像素3时间像素3

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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