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Updated: Jan 8, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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基于人工智能的分析算法,包括纳米尺度结构变化和光谱圆测量中的测量角度错位.

Juwon Jung1, Leeju Hwang1, Nagyeong Kim1

  • 1Department of Mechanical Engineering, Yonsei University, Seoul, Republic of Korea.

Nanophotonics (Berlin, Germany)
|December 22, 2025
PubMed
概括

本研究引入了一种先进的光谱圆测量 (SE) 分析框架,以准确地描述纳米结构,计算变化并改进制造业的计量学.

关键词:
制造过程引起的结构变化.测量角度 - 测量角度纳米结构是一种纳米结构.谱学圆测量法 谱学圆测量法

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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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