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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a

Yaguchi1, Kamino, Ishitani

  • 1School of Engineering, Ibaraki University, Narusawa-cho, Hitachi, Ibaraki 316-0031, Japan

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 30, 1999
PubMed

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