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Compression of Secondary Ion Microscopy Image Sets Using a Three-dimensional Wavelet Transformation.

Wolkenstein1, Hutter

  • 1Institute of Analytical Chemistry, Vienna University of Technology, Getreidemarkt 9/151, 1060 Vienna, Austria

Summary

This study introduces a 3-D wavelet transform for compressing 3-D secondary ion microscopy (SIMS) data. This method achieves significantly higher compression ratios than 2-D techniques, aiding in efficient data archiving.

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