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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
10:54

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Published on: July 26, 2014

Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion

Yaguchi1, Kamino, Sasaki

  • 1School of Engineering, Ibaraki University, Narusawa-cho, Hitachi, Ibaraki 316-0031, Japan

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 3, 2000
PubMed

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