Related Experiment Video
Updated: Aug 6, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
Development of a 1 MV field-emission transmission electron microscope
T Kawasaki1, I Matsui, T Yoshida
1Advanced Research Laboratory, Hitachi, Ltd, Hatoyama, Saitama, Japan. tkawa@harl.hitachi.co.jp
Abstract:
We developed a 1 MV field-emission transmission electron microscope. This paper reports details and specifications of the instrument. The microscope was designed to obtain a bright and coherent electron beam by using the field emission gun equipped with a pre-accelerating magnetic lens and the high-voltage power supply with high stability (0.5 ppm min(-1)). Using this microscope, the brightness of 1.8 x 10(10) A cm(-2) sr(-1) and the lattice resolution of 49.8 pm were attained.
Related Concept Videos
Overview of Electron Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Transmission Electron Microscopy
Preparation of Samples for Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques

