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Related Experiment Videos

Microelectronics effects as seen on CRRES.

E G Mullen1, K P Ray

  • 1Phillips Laboratory, Hanscom AFB, MA 01731, USA.

Advances in Space Research : the Official Journal of the Committee on Space Research (COSPAR)
|October 1, 1994
PubMed
Summary
This summary is machine-generated.

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The Combined Release and Radiation Effects Satellite (CRRES) studied microelectronics, finding cosmic rays caused single event upsets (SEUs) across a wide radiation zone. Proton radiation, however, caused significantly more SEUs in sensitive chips.

Area of Science:

  • Space physics
  • Microelectronic engineering
  • Radiation effects on electronics

Background:

  • The space radiation environment poses risks to microelectronic systems.
  • Understanding degradation and single event upsets (SEUs) is crucial for satellite reliability.
  • Previous research highlighted the impact of various radiation sources on electronics.

Purpose of the Study:

  • To measure total dose degradation and SEUs on diverse microelectronic devices.
  • To correlate microelectronic performance with the high-energy particle environment.
  • To analyze the cause-and-effect relationship between energetic particles and device behavior.

Main Methods:

  • Utilized the MicroElectronics Test Package (MEP) on the CRRES satellite.
  • Monitored 60 device types in an 18-degree inclination orbit (350 km to 36000 km).

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  • Conducted simultaneous measurements of the high-energy particle environment.

    • Main Results:

    • Galactic cosmic ray background was minimal during the CRRES mission.
    • Cosmic ray-induced SEUs showed an equal upset probability across a broad L-shell range (8.5 RE to <3.0 RE).
    • Proton-sensitive chips experienced over 100 times fewer cosmic ray upsets than proton-induced upsets in radiation belts.

    Conclusions:

    • Despite a low background, cosmic rays significantly impacted microelectronics across a wide spatial distribution.
    • Proton radiation in the inner belts is a far greater SEU threat than cosmic rays.
    • Multiple upsets were equally common for both proton and cosmic ray events.