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Single event upsets of spacecraft microelectronics exposed to solar cosmic rays
1Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University, Russia.
Radiation Measurements
|November 1, 1996
Summary
This study presents a new technique to assess single-event upset (SEU) rates in spacecraft electronics from solar particle events. Calculations reveal a strong dependence of the solar proton-to-ion ratio on shielding thickness.
Area of Science:
- Spacecraft microelectronics
- Radiation effects
- Astrophysics
Background:
- Spacecraft electronics are vulnerable to single-event upsets (SEUs) caused by solar particle radiation.
- Understanding SEU mechanisms, including heavy ion and secondary proton impacts, is crucial for mission reliability.
Purpose of the Study:
- To describe a novel technique for evaluating SEU rates induced by solar particle incidence.
- To incorporate primary (heavy ion) and secondary (proton-induced) SEU mechanisms into the evaluation.
Main Methods:
- Development of original computational models for solar particle energy spectra.
- Creation of models for SEU occurrence in electronics.
- Analysis of TDRS-1 Fairchild 93L422 IC data exposed to protons and ions during a 1989 solar cosmic ray event.
- Inclusion of microcircuit shielding distribution in the analysis.
Main Results:
- The developed technique effectively evaluates SEU rates from solar particle events.
- Calculations demonstrated a strong dependence of the solar proton-to-ion ratio on shielding thickness.
- The analysis provided insights into the combined effects of primary and secondary SEU mechanisms.
Conclusions:
- The new technique offers a comprehensive approach to assessing SEU rates in spacecraft electronics.
- Shielding plays a critical role in modulating the impact of solar particle radiation, influencing the proton-to-ion ratio.
- Accurate modeling of solar particle spectra and SEU occurrence is essential for robust spacecraft design.