A T Lenstra1, J F Van Loock, B Rousseau
1Department of Chemistry, University of Antwerp (UIA), Universiteitsplein 1, B-2610 Antwerpen, Belgium. lenstra@uia.ua.ac.be
This study quantifies X-ray beam monochromaticity using graphite monochromators, finding it decreases with wavelength. A spectral modeling routine corrects for scan-angle-induced errors, ensuring accurate crystallographic analysis.
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