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Stress influence on interface in plasma-sprayed hydroxyapatite coatings on titanium alloy
P Millet1, E Girardin, C Braham
1UFR Odontologie, 2 rue du general Koenig, LACM, EA3304, Université de Reims-Champagne-Ardenne, F51100 France. pierre.millet@univ-reims.fr
Journal of Biomedical Materials Research
|April 12, 2002
Summary
Plasma-spraying induces residual stresses in hydroxyapatite coatings on implants. Neutron diffraction revealed no significant stress differences near the interface, while X-ray diffraction indicated compressive stress within the coating.
Area of Science:
- Biomaterials science
- Materials engineering
- Surface science
Background:
- Hydroxyapatite (HA) coatings are crucial for implant biocompatibility.
- Residual and mechanical stresses significantly impact HA-coated implant performance.
- Understanding stress distribution is vital for improving implant longevity.
Purpose of the Study:
- To investigate macrostresses induced by plasma-spraying in HA coatings and at the implant interface.
- To compare the effectiveness of neutron diffraction and X-ray diffraction for stress analysis.
- To evaluate the impact of plasma-spraying on the stress state of HA coatings.
Main Methods:
- Neutron diffraction for bulk strain distribution analysis.
- Conventional X-ray diffraction for residual stress determination in the HA coating.
- Non-destructive and destructive stress measurement techniques were employed.
Main Results:
- Neutron diffraction showed no significant stress difference between coated and non-coated samples near the interface.
- X-ray diffraction revealed compressive stress within the hydroxyapatite coating.
- Neutron diffraction offers non-destructive analysis of thick coatings, but with a large-gauge volume.
Conclusions:
- Plasma-spraying induces compressive residual stresses in hydroxyapatite coatings.
- Neutron diffraction is suitable for non-destructive bulk stress analysis, while X-ray diffraction is effective for surface/near-surface stress measurements.
- Destructive methods like polishing for X-ray diffraction can potentially alter the measured stress field.