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Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and

A I Kirkland1, W O Saxton

  • 1Department of Materials Science and Metallurgy, Pembroke Street, Cambridge CB2 3QZ, UK. aik10@cam.ac.uk

Journal of Microscopy
|May 10, 2002
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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