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The Goos-Hänchen effect at Bragg diffraction.

Kenji Tamasaku1, Tetsuya Ishikawa

  • 1RIKEN Harima Institute/SPring-8, Mikazuki, Hyogo 679-5148, Japan. tamasaku@postman.riken.go.jp

Acta Crystallographica. Section A, Foundations of Crystallography
|June 29, 2002
PubMed
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The Goos-Hänchen effect, a beam shift due to reflectivity phase changes, was observed in hard X-ray diffraction. This finding aligns with theoretical predictions for X-ray optics.

Area of Science:

  • Physics
  • Optics
  • X-ray Science

Background:

  • The Goos-Hänchen effect describes a spatial shift of a reflected light beam.
  • This phenomenon is well-documented in the visible light spectrum.
  • Understanding beam shifts is crucial for precise optical measurements.

Purpose of the Study:

  • To investigate the Goos-Hänchen effect in the hard X-ray region.
  • To examine Bragg-case diffraction under conditions exhibiting this effect.
  • To validate theoretical models for X-ray reflectivity.

Main Methods:

  • Experimental observation of reflected beams during hard X-ray diffraction.
  • Analysis of the phase of complex reflectivity as a function of incident angle.
  • Comparison of experimental beam shifts with theoretical calculations.

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Main Results:

  • The Goos-Hänchen effect was successfully observed for Bragg-case diffraction in hard X-rays.
  • A significant incident-angle dependence of the complex reflectivity phase was confirmed.
  • Measured beam shifts closely matched theoretical predictions.

Conclusions:

  • The Goos-Hänchen effect is demonstrable in hard X-ray diffraction.
  • This observation extends the understanding of wave optics into the X-ray regime.
  • Experimental results validate theoretical frameworks for X-ray beam manipulation.