Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology.

Hyunjung Shi1, Seungbum Hong, Jooho Moon

  • 1Stage Laboratory, Samsung Advanced Institute of Technology, Suwon, South Korea. hjshin@sait.samsung.co.kr

Ultramicroscopy
|September 5, 2002
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Nanoscale frictional imaging of ferroelectric domains.

Science advances·2026
Same author

Nucleation-to-Propagation Switching Modes in Ferroelectric Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Capacitors.

Nano letters·2026
Same author

Deriving a Korean SF-6Dv2 Value Set Using a Discrete Choice Experiment with Duration.

PharmacoEconomics·2026
Same author

Quantitative Analysis of Topographic Crosstalk in DART-ESM Arising from Feedback-Loop-Delay-Induced Contact Stiffness Variations in Battery Materials.

Small methods·2026
Same author

Wafer-Scale 2D High-Entropy Transition Metal Dichalcogenide Thin-Film Catalysts for Efficient and Durable Photoelectrochemical Hydrogen Production.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

A novel fracture lattice in spiny mouse skin facilitates tissue autotomy and regeneration.

bioRxiv : the preprint server for biology·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
Same journal

Temperature-dependent mean inner potential of polystyrene spheres measured using off-axis electron holography.

Ultramicroscopy·2026
See all related articles

A novel atomic force microscopy (AFM) system achieves ultrahigh data storage density over 200 Gb/in2 by writing bits on ferroelectric films. This advanced information storage technology also investigates data retention and piezoelectric properties.

Area of Science:

  • Materials Science and Engineering
  • Nanotechnology
  • Data Storage Technology

Background:

  • Development of information storage systems with significantly higher data densities is crucial for modern computing.
  • Atomic Force Microscopy (AFM) offers nanoscale precision for potential high-density data writing and reading.
  • Micro-electro-mechanical systems (MEMS) are key for integrating and miniaturizing AFM for practical applications.

Purpose of the Study:

  • To develop and demonstrate an ultrahigh storage density information system using AFM principles.
  • To investigate the feasibility of using AFM with piezoresponse mode for data bit manipulation in ferroelectric films.
  • To analyze data retention phenomena and local piezoelectric properties of lead zirconate titanate (PZT) films.

Main Methods:

Related Experiment Videos

  • Utilized atomic force microscopy (AFM) in conjunction with piezoresponse mode for data writing and reading.
  • Employed micro-electro-mechanical systems (MEMS) technology for the integration and miniaturization of the AFM system.
  • Fabricated and tested ferroelectric lead zirconate titanate (Pb(Zr(x)Ti(1 - x))O3) films for data storage.

Main Results:

  • Achieved data bits as small as 40 nm in diameter, demonstrating a data storage density exceeding 200 Gb/in2.
  • Successfully wrote and read information bits on ferroelectric PZT films using the developed AFM technique.
  • Observed and investigated the retention loss phenomenon in the stored data bits via AFM.

Conclusions:

  • The developed AFM-based system shows significant potential for achieving ultrahigh data storage densities.
  • The piezoresponse mode of AFM is effective for nanoscale data manipulation in ferroelectric materials.
  • Further investigation into retention loss and piezoelectric properties of PZT films is essential for practical implementation.