Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Nanochemical surface analyzer in CMOS technology.

W Frank1, D Lange, S Lee

  • 1Physical Electronics Laboratory, ETH Zurich, Switzerland.

Ultramicroscopy
|September 5, 2002
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Search for Flavor-Changing Neutral Current Interactions of the Top Quark and Higgs Boson in Final States with Two Photons in Proton-Proton Collisions at sqrt[s]=13  TeV.

Physical review letters·2022
Same author

Search for Resonances Decaying to Three W Bosons in Proton-Proton Collisions at sqrt[s]=13  TeV.

Physical review letters·2022
Same author

Probing Charm Quark Dynamics via Multiparticle Correlations in Pb-Pb Collisions at sqrt[s_{NN}]=5.02  TeV.

Physical review letters·2022
Same author

First Search for Exclusive Diphoton Production at High Mass with Tagged Protons in Proton-Proton Collisions at sqrt[s]=13  TeV.

Physical review letters·2022
Same author

Observation of the B_{c}^{+} Meson in Pb-Pb and pp Collisions at sqrt[s_{NN}]=5.02  TeV and Measurement of its Nuclear Modification Factor.

Physical review letters·2022
Same author

Observation of B <math></math> <math></math> <math></math> (2S)K <math> </math> and B <math></math> <math></math> <math></math> (2S)K <math></math> decays.

The European physical journal. C, Particles and fields·2022
Same journal

Predictive drift compensation of multi-frame STEM via live scan modification.

Ultramicroscopy·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
See all related articles

This study introduces a novel atomic force microscopy (AFM) cantilever for nanochemical analysis. The integrated system reliably distinguishes between hydrophilic and hydrophobic surfaces without external equipment.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Chemistry

Background:

  • Traditional atomic force microscopy (AFM) systems often require complex external components for sample analysis.
  • Distinguishing between hydrophilic and hydrophobic surfaces at the nanoscale is crucial for various applications.

Purpose of the Study:

  • To develop an integrated AFM cantilever system for direct detection of surface hydrophilicity/hydrophobicity.
  • To enable simplified nanochemical surface analysis.

Main Methods:

  • Fabrication of an AFM cantilever using CMOS processes with integrated thermal actuators and Wheatstone bridge sensors.
  • Functionalization of cantilever tips with self-assembled monolayers to create hydrophobic probes.
  • Utilizing force-distance curves to measure tip-surface interactions.

Related Experiment Videos

Main Results:

  • The developed AFM cantilever system successfully differentiates between hydrophilic and hydrophobic samples.
  • Optimized Wheatstone bridge sensors achieved a sensitivity of 8.0 microV/nm.
  • Actuator efficiency reached 713 nm/mW.

Conclusions:

  • The integrated AFM cantilever offers a streamlined approach to nanochemical surface analysis.
  • The system eliminates the need for external laser detection and piezoelectric drives.
  • This technology advances the capabilities of nanoscale surface characterization.