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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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An FTIR study of the surface chemistry of the dynamic Si(100) surface during etching in alkaline solution
Wolfgang Haiss1, Philipp Raisch, David J Schiffrin
1University of Liverpool, Department of Chemistry, UK.
Faraday Discussions
|September 14, 2002
Abstract:
In situ FTIR spectroscopy has been used in the attenuated total reflectance (ATR) mode to investigate the surface chemistry of etching Si(100) surfaces in aqueous KOH. The effect of solution concentration and electrode potential on the Si-H vibrations has been explored and the experimental results compared with density functional theory calculations. In addition. the kinetics of surface passivation of n-Si(100) has been investigated using FTIR spectroscopy.
