Related Experiment Video
Updated: Aug 14, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
X-ray interferometry with microelectronvolt resolution
Yu V Shvyd'ko1, M Lerche, H-C Wille
1Institut für Experimentalphysik, Universität Hamburg, D-22761 Germany. Yuri.Shvydko@desy.de
Abstract:
We demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors--a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76 mu eV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.
Related Concept Videos
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Super-resolution Fluorescence Microscopy
Overview of Electron Microscopy
Transmission Electron Microscopy
Overview of Microscopy Techniques

