A single-tilt TEM stereomicroscopy technique for crystalline materials

A new single-tilt technique for performing TEM stereomicroscopy of strain fields in crystalline materials has been developed. The technique is a weak beam technique that involves changing the value of g and/or s g while tilting across a set of Kikuchi bands. The primary benefit of the technique is it can be used with single-tilt TEM specimen holders including many specialty holders such as in situ straining, heating, and cooling holders. Standard stereo-TEM techniques are almost always limited to holders allowing two degrees of rotational freedom (i.e., double-tilt or tilt/rotation holders). An additional benefit of the new technique is that it eliminates the need to focus with the specimen height control. These advantages make it useful for stereo viewing or for quantitative stereomicroscopy provided necessary consideration is given to errors that may result from the technique.