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Related Experiment Videos

Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source.

A L D Kilcoyne1, T Tyliszczak, W F Steele

  • 1Department of Physics, North Carolina State University, Raleigh, NC 27895, USA.

Journal of Synchrotron Radiation
|February 28, 2003
PubMed
Summary
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Two new soft X-ray scanning transmission microscopes were developed at the Advanced Light Source (ALS), achieving 30 nm resolution. These advanced microscopes offer precise imaging capabilities for scientific research.

Area of Science:

  • X-ray microscopy
  • Advanced Light Source (ALS)
  • Nanotechnology

Background:

  • Soft X-ray scanning transmission microscopy is crucial for nanoscale imaging.
  • Existing technologies faced limitations in precision and stability.

Purpose of the Study:

  • To design, build, and commission two new soft X-ray scanning transmission microscopes.
  • To enhance imaging precision and stability using advanced control systems.

Main Methods:

  • Implementation of interferometer control for precise zone plate positioning.
  • Development of digital and custom feedback control systems.
  • Utilizing undulator and bending-magnet beamlines for illumination.

Main Results:

Related Experiment Videos

  • Achieved long-term positional stability and compensation for transverse displacement.
  • Enabled low-distortion orthogonal X, Y imaging.
  • Resolved periodic features with 30 nm half period using a 40 nm outermost zone width zone plate.
  • Demonstrated high count rates (tens of MHz and >3 MHz) with high energy and spatial resolution.

    • Conclusions:

    • The new soft X-ray microscopes offer significant advancements in nanoscale imaging.
    • The developed control systems and beamline integration provide high-performance imaging capabilities.
    • These instruments are poised to advance research in various scientific fields requiring high-resolution X-ray microscopy.