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Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips
L Aeschimann1, T Akiyama, U Staufer
1University of Neuchâtel, Institute of Microtechnology, Jaquet-Droz 1, 2007 Neuchâtel, Switzerland. laure.aeschimann@unine.ch
Abstract:
The fabrication of silicon cantilever-based scanning near-field optical microscope probes with fully aluminium-coated quartz tips was optimized to increase production yield. Different cantilever designs for dynamic- and contact-mode force feedback were implemented. Light transmission through the tips was investigated experimentally in terms of the metal coating and the tip cone-angle. We found that transmittance varies with the skin depth of the metal coating and is inverse to the cone angle, meaning that slender tips showed higher transmission. Near-field optical images of individual fluorescing molecules showed a resolution < 100 nm. Scanning electron microscopy images of tips before and after scanning near-field optical microscope imaging, and transmission electron microscopy analysis of tips before and after illumination, together with measurements performed with a miniaturized thermocouple showed no evidence of mechanical defect or orifice formation by thermal effects.