Low-temperature scanning system for near- and far-field optical investigations

A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope and a dedicated spectrometer was realized. The set-up allows the optical investigation of samples at temperatures from 10 to 300 K. The sample positioning range is as large as 5 x 5 x 5 mm3 and the spatial resolution is in the range of 1.5 micro m in the far-field optical microscopy mode at low temperatures. In the scanning near-field optical microscope mode the resolution is defined by the microfabricated cantilever probe, which is placed in the focus of a double-mirror objective. The tip-to-sample distance in the scanning near-field optical microscope is controlled by a beam deflection system in dynamic scanning force microscopy mode. After a description of the apparatus, scanning force topography images of self-assembled InAs quantum dots on a GaAs substrate with a density of less than one dot per square micrometre are shown, followed by the first spectroscopic investigations of such a sample. The presented results demonstrate the potential of the system.